| specifications︰ | 1. Standard: ASTM 903, CIE 130-1998, NREL lab standards
2. Wavelength: 380-950nm (standard), 380-1100nm, 380-1700nm (option)
3. Function: measure transmittance, transmittance scattering rate, reflectance, reflectance scattering rate, surface roughness, and film thickness
4. Suitable Samples: monocrystalline and polycrystalline silicon wafers, thin-film silicon solar cells, SiNOx, SiO2, Amorphous, TCO thin films
5. Light Source: 150W tungsten halogen (NIR wavelength) or xenon light source (UV wavelength)
6. Speed: 1sec / per sample
7. Spot Size: 1-5mm
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| Export Markets︰ | Mainland China, Japan, Korea, U.S.A. |
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